Optimize visibility with higher

resolution & performance

Resolution performance is about more

than just highest specified resolution.

With today’s dynamic research demands,

you want to achieve high-resolution

3D imaging across the widest range of

sample types. ZEISS VersaXRM® 730

with the exclusive 40×-Prime (40×-P)

objective, enables you to push the limits

of submicron imaging with unparalleled

resolution performance of 450-500 nm

across the full range of source voltage,

from 30 kV to 160 kV. AI allows you to

gain deeper insights and extend your

capabilities by improving image quality

and expanding your field of view.

Improve productivity & accessibility

with human-centered design

The physics of X-ray imaging can be

complex, so ZEISS XRM researchers

studied user habits, dove into their

challenges and employed human-centered

design (HCD) principles to develop the

award-winning ZEN navx™ guidance and

control system for VersaXRM. ZEN navx

enables even the newest user in a busy

environment to be immediately productive

doing advanced 3D X-ray microscopy,

greatly reducingthe burden of training.

It also allows your experienced users to

explore the full versatility of the platform.

ZEN navx File Transfer Utility (FTU)

automatically transfers data from the

microscope to where you need it,

when you need it.

Achieve efficient, fast targeting

with end-to-end 3D navigation

With VersaXRM 730, you can now navigate

in 3D, image in 3D, and analyze in 3D with

an innovative and immersive end-to-end

experience. Innovation in throughput and

image quality performance across both

hardware and software help you achieve

maximum impact with your research.

• Acquire more data in less system time

• Get the right data the first time with the

intuitive ZEN navx interface

• Achieve rapid turnaround on imaging or

sample inspection with one-minute

tomographies using FAST Mode and

Flat Panel Extension (FPX)

• Pinpoint images with confidence using

Volume Scout for true 3D feature targeting